Measurement Routines

The ARKEO platform supports a wide range of electrical and optoelectronic characterization techniques.
The routines are grouped by measurement philosophy and device type.

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Steady-State Measurements

• JV
  Current–voltage characterization under illumination.
  Theory →

• MPPT
  Maximum Power Point Tracking and stability analysis.
  Theory →

• IPCE
  Spectral external quantum efficiency measurement.
  Theory →

• Dark JV
  Injection, SCLC and trap analysis in dark conditions.
  Theory →

• Photoluminescence
  Radiative recombination and QFLS characterization.
  Theory →

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