Measurement Routines¶
The ARKEO platform supports a wide range of electrical and optoelectronic characterization techniques.
The routines are grouped by measurement philosophy and device type.
Steady-State Measurements¶
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JV
Current–voltage characterization under illumination.
Theory → -
MPPT
Maximum Power Point Tracking and stability analysis.
Theory → -
Dark JV
Injection, SCLC and trap analysis in dark conditions.
Theory → -
IPCE
Spectral external quantum efficiency measurement.
Theory → -
Photoluminescence
Radiative recombination and QFLS characterization.
Theory →